Last edited by Samugul
Monday, May 18, 2020 | History

3 edition of Optical properties of semiconductor-metal composite thin films in the infrared region found in the catalog.

Optical properties of semiconductor-metal composite thin films in the infrared region

Optical properties of semiconductor-metal composite thin films in the infrared region

  • 203 Want to read
  • 11 Currently reading

Published by National Aeronautics and Space Administration, National Technical Information Service, distributor in [Washington, DC, Springfield, Va .
Written in English

    Subjects:
  • Thin films.,
  • Refractivity.,
  • Transmittance.,
  • Germanium.,
  • Silver.,
  • Semiconductors (Materials),
  • Metal films.,
  • Infrared spectra.

  • Edition Notes

    Other titlesOptical properties of semiconductor metal composite thin films in the infrared region.
    StatementC.L. Nagendra and James L. Lamb.
    Series[NASA contractor report] -- NASA-CR-203121., NASA contractor report -- NASA CR-203121.
    ContributionsLamb, James L., United States. National Aeronautics and Space Administration.
    The Physical Object
    FormatMicroform
    Pagination1 v.
    ID Numbers
    Open LibraryOL15508196M

    Angstroms) to several hundreds of micrometers. Their optical properties depend on microstructure. The objective of this work is to determine the optical properties of thin films and semiconductor. The most common optical properties are the complex refractive index and thickness, as well as all notions of transmission and reflection. This paper describes a solution-phase synthesis of high-quality vanadium dioxide thermochromic thin films. The films obtained showed excellent visible transparency and a large change in transmittance at near-infrared (NIR) wavelengths before and after the metal−insulator phase transition (MIPT). For a 59 nm thick single-layer VO2 thin film, the integral values of visible transmittance (Tint Cited by:

    This book discusses and compares infrared, Raman and photoluminescence optical methods for non-destructive characterization of semi-conducting materials, structures, and devices. Applications are illustrated through many case studies in silicon, GaAs, AIxGal-xAs and other important materials. Infrared reflection-absorption spectroscopy of thin film structures by Steven James Finke A Dissertation Submitted to the Graduate Faculty in Partial Fulfillment of the Requirements for the Degree of DOCTOR OF PHILOSOPHY Major: Chemical Engineering Approved: In Charge of Major Work For the Majo epartment Foryxîie Graduate College.

      Measurements of the optical constants of metal-insulator composites in the far infrared provide information about the dielectric functions (DF) of the components and about the electromagnetic interaction of the different grains. If the metal particles — and their separations — are much smaller than the wavelength of the light, the sample can be characterized in terms of an effective Cited by: 5. STEPS TO CHOOSING INFRARED OPTICAL MATERIAL OPTI 1. Understand infrared technology and properties of optical materials 2. Consider the top three material properties 3. Compare optical materials 4. Determine the optimum solution for the intended operation 2.


Share this book
You might also like
Research and evaluation

Research and evaluation

Great Puzzles of the Times - Football

Great Puzzles of the Times - Football

orange minstrel

orange minstrel

Alexander Pope.

Alexander Pope.

Ground-water flow and transport modeling of the NRC-licensed waste disposal facility, West Valley, New York

Ground-water flow and transport modeling of the NRC-licensed waste disposal facility, West Valley, New York

The making of American society

The making of American society

History of the Oak Ridge United Presbyterian Church of Yellow Creek Township, Columbiana County, from its first meeting held on July 28, 1849 to September 30, 1979

History of the Oak Ridge United Presbyterian Church of Yellow Creek Township, Columbiana County, from its first meeting held on July 28, 1849 to September 30, 1979

little book of big achievements

little book of big achievements

Optical properties of semiconductor-metal composite thin films in the infrared region Download PDF EPUB FB2

Optical properties of semiconductor-metal composite thin films in the infrared region. Nagendra CL, Lamb JL. Germanium:silver (Ge:Ag) composite thin films having different concentrations of Ag, ranging from 7% to 40%, have been prepared by dc cosputtering of Ge and by: 5.

The optical absorption properties of Ag-BaO composite thin film were measured, and two absorption peaks were observed in the visible and near-infrared bands.

Germanium: silver (Ge:Ag) composite thin films having different concentrations of Ag, ranging from 7% to 40%, have been prepared by dc cosputtering of Ge and Ag.

The films' surface morphology and optical properties have been characterized using transmission electron microscopy and infrared spectrophotometry. It is seen that, although the films that contain lower concentrations of Ag have.

Germanium:Silver (Ge:Ag) composite thin films having different concentrations of Ag, ranging from 7 % to 40 % have been prepared by dc co-sputtering of Ge and Ag and the films ’ surface morphology and optical properties have been characterized using transmission electron microscopy (TEM) and infrared spectrophotometry.

Sputter-deposited TiN and MoSi have shown the highest optical absorption in the infrared wavelengths relative to NbN, NbTiN and ALD-deposited TiN. We have also modelled the performance of a semi-infinite metal air interface as a plasmonic structure with the above mentioned refractory metal based thin films as the plasmonic by: 5.

Semiconductor‐metal graded‐index composite thin films for infrared applicationsCited by: 1. The optical properties of a thin metal film are derived, with a thin film defined as having a thickness smaller than the wavelength of the radiation and the skin depth.

The derivation is based on the continuity equation for the electric field and on the energy balance for the incident, reflected, transmitted, and absorbed energy current.

The use of thin metal films as anti‐interference Cited by: Semiconductor‐metal graded‐index composite thin films for infrared applications Article (PDF Available) in Journal of Applied Physics 76(11) - January with 40 Reads.

A synthesis method has been developed for preparation of vanadium oxide thermometer thin film for microbolometer application.

The structure presented is a nm thin film prepared by sputter-depositing nine alternating multilayer thin films of vanadium pentoxide (V2O5) with thickness of 15 nm and vanadium with thickness of 5 nm followed by postdeposition annealing at °C in nitrogen Cited by: 6.

Optical Properties of Thin Semiconductor Films GrolikBenno,KoppJoachim October, 31st 1 Introduction Optical experiments provide a good way of examining the properties of semiconductors. Particulary measuring the absorption coefficient for various energies gives information about the band gaps of the material.

KnowledgeFile Size: KB. The optical properties of metal nanoparticles have long been of interest in physical chemistry, starting with Faraday's investigations of colloidal gold in the middle s.

More recently, new lithographic techniques as well as improvements to classical wet chemistry methods have made it possible to synthesize noble metal nanoparticles with a wide range of sizes, shapes, and dielectric Cited by: ultraviolet (UV) and visible (VIS) wavelength region into the infrared (IR) wavelength region [5].

The tunability of the optical properties of these metal-dielectric composites makes them suitable for a variety of applications including surface-enhanced Raman scattering (SERS) sensors [6], color filters [], and all optical switching [10].

Optical properties of thin films. O S Heavens. Reports on Progress in Physics, Vol All articles. the many methods now available for the determination of the thickness and optical constants of materials in the form of thin films.

The range, accuracy and conditions of application of the various methods are summarized. Although less Cited by: The optical properties of amorphous and crystalline silicon G K M Thutupalli and S G Tomlin-Recent citations Optical properties of semiconductor-metal composite thin films in the infrared region C.

Nagendra and James L. Lamb-Optimization of the optical characterization of opaque materials D Minkov-Method for calculating the optical. Second, we will model the film as a composite medium with refractive index given by, to first order, some weighted average between TiO 2 and Au because the wavelength of the incident light is much greater than the gold particle size, especially in the near infrared region.

(3a) n film = 1 – x n T i O 2 + x n Au (3b) k film = x k Au where n is Cited by: 4. OPTICAL PROPERTIES OF DIELECTRIC AND SEMICONDUCTOR THIN FILMS 3 Analytic solutions can be given if we assume that the incident wave is a pure wave and that the boundary layers are regular.

In more complicated situations, numerical solutions are nec-Cited by: 6. Present work reports the effect of film thickness on optical properties of vacuum evaporated thin films of GaAs via transmittance and reflectance measurements in the wavelength range from to nm.

Optical parameters such as absorption co-efficient, refractive index, extinction co-efficient, dielectric constants were Size: KB. The TiO X thin films were grown on the glass substrate for the low-e film applications by direct-current magnetron sputtering methods. The composite nature of dielectric and metallic phases including Ti 2 O 3, TiO 2 and amorphous TiOx were identified from the comparative study of x-ray diffraction and Raman spectroscopy.

The coalescent nanocolumnar structure revealed from scanning electron. Optical constants [n,k] of 30– nm SiO2 films, thermally grown on c-Si substrates, are obtained numerically from [R,T] data. The calculations are done at each wavelength, no a priori assumptions regarding dispersion relations are needed.

The technique also provides the film thickness, whose values agree with ellipsometric measurements. The optical constants are compared to those of bulk Cited by:   Optical properties of semiconductor-metal composite thin films in the infrared region. Nagendra CL, Lamb JL Appl Opt, 34(19), 01 Jul Cited by: 5.

TiN and TiNxOy thin films share many properties such as electrical and optical properties. In this work, a comparison is conducted between TiN (with and without annealing at °C in air and vacuum) and TiNxOy thin films deposited by using RF magnetron sputtering with the same pure titanium target, Argon (Ar) flow rate, nitrogen flow rates, and deposition time on stainless steel by: 1.Optical experiments provide a good way of examining the properties of semiconductors.

Particulary measuring the absorption coefficient for various energies gives information about the band gaps of the material. Knowledge of these band gaps is extremely important for understanding the electrical properties of a semiconductor, and is therefore of great practical interest.5 films for visible region and with LaF 3 films for UV region.

Another part of the thesis consists of applying already existing ALD processes for novel optical devices. In addition to the high reflecting mirrors, a thin ALD Al 2O 3 film on top of a silver coating was proven to .